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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Fu, S.T. Liu, S.-M.J. Das, M.B. Chao, P.C. Duh, K.-H.G. Ho, P. Ballingall, J.M. |
| Copyright Year | 1989 |
| Description | Author affiliation: Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA (Fu, S.T.; Liu, S.-M.J.; Das, M.B.) |
| Abstract | The microwave characterization of 0.25- mu m gate-length MODFETs at 300 and 77 K is reported. Microwave S-parameter measurements of MODFETs from 0.45 to 20 GHz were used to extract their HF equivalent network parameters. After allowing for the parasitic gate and drain-to-gate feedback capacitances, the intrinsic unity-current gain frequency was determined. Using a theoretical model, the effective carrier saturation velocity and average velocity ( nu /sub av/) were obtained for the conventional AlGaAs/GaAs, the pseudomorphic AlGaAs/InGaAs/GaAs, and lattice-matched InAlAs/InGaAs/InAlAs on InP samples at 300 K and 77 K. The extracted values of nu /sub a/ range from 0.82*10/sup 7/ cm/s to 3.84*10/sup 7/ cm/s, respectively, depending on the type of MODFET and operating temperature. These high values of nu /sub av/ indicate that the velocity overshoot effect is present in the devices tested.<> |
| Starting Page | 19 |
| Ending Page | 23 |
| File Size | 352475 |
| Page Count | 5 |
| File Format | |
| DOI | 10.1109/LTSE.1989.50174 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1989-08-07 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Gallium arsenide Feedback Hafnium HEMTs Indium gallium arsenide Indium compounds Scattering parameters MODFETs Microwave measurements Parasitic capacitance |
| Content Type | Text |
| Resource Type | Article |
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