NDLI: Optimizing test time for core-based 3-D integrated circuits by genetic algorithm

Content Provider	IEEE Xplore Digital Library
Author	Kaibartta, T. Giri, C. Rahaman, H. Das, D.K.
Copyright Year	2015
Description	Author affiliation: Dept. of Comput. Sci. & Eng, IIT (ISM), Dhanbad, India (Kaibartta, T.) \|\| Dept. of Comput. Sci. & Eng, Indian Inst. of Eng. Sci. & Technol, Shibpur, India (Giri, C.; Rahaman, H.) \|\| Dept. of Comput. Sci. & Eng., Jadavpur Univ., Jadavpur, India (Das, D.K.)
Abstract	System-on-a-chip (SOC) uses embedded cores that require a test access architecture called Test Access Mechanism (TAM) to access the cores for the purpose of testing. This approach can be used for testing of three dimensional stacked integrated circuits (SICs) based on through-silicon vias (TSVs). Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D stacked ICs implemented using TSVs technology and present genetic algorithm for minimizing the post bond test time for 3D SICs under the constraints on the number of TSVs and the available TAM width. Given a TAM width available to test a system-on-a-chip, our algorithm partitions this width into different groups and places the cores of these groups in different layers in 3D design with the goal to optimize the total test time. The experimental results establish the effectiveness of our algorithm.
Starting Page	62
Ending Page	67
File Size	318167
Page Count	6
File Format	PDF
e-ISBN	9781467374958
DOI	10.1109/ACQED.2015.7274008
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-08-04
Publisher Place	Malaysia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Three-dimensional displays Sociology System-on-chip Partitioning algorithms Statistics Biological cells Optimization
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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