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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Upadhyay, P. Amarnath, J. Upadhyay, P. |
| Copyright Year | 2008 |
| Description | Author affiliation: Dept. of EEE, VNR Vignan Jyothi Inst. of Eng. & Technol., Hyderabad (Upadhyay, P.) |
| Abstract | Metallic particle contaminations impair the insulation integrity of gas insulated equipment. The contaminants can be produced by an abrasion between components during assembly or operations. These particles can either be free to move in the GIS bus or they may stick either to an energized electrode or to an insulator surface. In case a metallic particle crosses the gap and comes into contact with the inner electrode or if a metallic particle adheres to the inner conductor, the particle will act as a protrusion on the surface of the electrode. Consequently, voltage required for breakdown of the GIS may be significantly decreased. Diluted $SF_{6}/N_{2}$ mixtures could be a substitute to pure $SF_{6}$ as insulation medium for high voltage gas insulated systems. They promise to have a lower environmental impact than a system insulated with pure $SF_{6}$ for the same rating. The main issue concerning the practical use of such mixtures is their behavior in the presence of particle contamination. In this paper, particle movement is determined in both coated and uncoated gas insulated bus-duct (GIB) with Sulphur Hexafluoride $(SF_{6})$ and Nitrogen $(N_{2})$ gas mixtures as insulating medium on application of 175 kV switching impulse voltage. In the gas mixture, conducting particle material considered for this study is Copper and Aluminum. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 174564 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424428069 |
| DOI | 10.1109/ICIINFS.2008.4798484 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-12-08 |
| Publisher Place | India |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Protrusions GIB Geographic Information Systems Surface contamination Switchgear Single Phase Conductors Gas Mixture Nitrogen Electrodes Breakdown voltage Medium voltage Gas insulation Assembly |
| Content Type | Text |
| Resource Type | Article |
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