NDLI: A FEM-Based Forward Solver for Studying the Forward Problem of Electrical Impedance Tomography (EIT) with A Practical Biological Phantom

Content Provider	IEEE Xplore Digital Library
Author	Bera, T.K. Nagaraju, J.
Copyright Year	2009
Description	Author affiliation: Department of Instrumentation, Indian Institute of Science-Bangalore, Karnataka, India -560012, Email: solarjnr@isu.iisc.ernet.in (Nagaraju, J.) \|\| Department of Instrumentation, Indian Institute of Science-Bangalore, Karnataka, India -560012, Email: tkbera@isu.iisc.ernet.in (Bera, T.K.)
Abstract	A Finite Element Method based forward solver is developed for solving the forward problem of a 2D-Electrical Impedance Tomography. The Method of Weighted Residual technique with a Galerkin approach is used for the FEM formulation of EIT forward problem. The algorithm is written in MatLAB7.0 and the forward problem is studied with a practical biological phantom developed. EIT governing equation is numerically solved to calculate the surface potentials at the phantom boundary for a uniform conductivity. An EIT-phantom is developed with an array of 16 electrodes placed on innerthe surface of the phantom tank filled with KCl solution. A sinusoidal current is injected through the current electrodes and the differential potentials across the voltage electrodes are measured. Measured data is compared with the differential potential calculated for known current and solution conductivity. Comparing measured voltage with the calculated data it is attempted to find the sources of errors to improve data quality for better image reconstruction.
Starting Page	1375
Ending Page	1381
File Size	3417641
Page Count	7
File Format	PDF
ISBN	9781424429271
DOI	10.1109/IADCC.2009.4809217
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-03-06
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Surface impedance forward solver inverse problem Voltage measurement EIT phantoms common mode feedback Conductivity forward problem Finite element methods Electrodes Computer languages finite element method Current measurement electrical impedance tomography Tomography Imaging phantoms Moment methods
Content Type	Text
Resource Type	Article

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