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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | JiCheng Liu WenJie Tian |
| Copyright Year | 2010 |
| Description | Author affiliation: Automation Institute, Beijing Union University, China (JiCheng Liu; WenJie Tian) |
| Abstract | Support vector machine (SVM) which overcomes the drawbacks of neural networks has been widely used for pattern recognition in recent years. A new optimization method for the fault diagnosis model is proposed. To overcome the deficiencies of low accuracy and high false alarm rate in fault diagnosis system, an integrated fault diagnosis model based on support vector regression and principal components analysis is proposed in the paper. Utilizing the character that principal components analysis algorithm, the reduces of the original dataset are calculated and used to train individual SVR classifier for ensemble, which increase the diversity between individual classifiers, and consequently, increase the detection accuracy. To validate the effectiveness of the proposed method, simulation experiments are performed based on the electronic circuit dataset. The real electronic circuit data sets are used to investigate its feasibility in fault diagnosis. The results show that the proposed method is a promised ensemble method owning to its high diversity, high detection accuracy and faster speed in fault diagnosis. |
| Starting Page | 5 |
| Ending Page | 8 |
| File Size | 565062 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424451920 |
| ISSN | 19483422 |
| DOI | 10.1109/CAR.2010.5456606 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-03-06 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | fault diagnosis Circuit simulation Optimization methods Electrical fault detection ensemble Pattern recognition principal components analysis Fault diagnosis Support vector machines support vector regression Fault detection Neural networks reduction Electronic circuits Principal component analysis |
| Content Type | Text |
| Resource Type | Article |
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