NDLI: Random matrix processes: Quantifying rates of change in MIMO systems

Content Provider	IEEE Xplore Digital Library
Author	Smith, P. McKay, M. Giorgetti, A. Chiani, M.
Copyright Year	2010
Description	Author affiliation: Department of Electronic and Computer Engineering, HKUST, Clear Water Bay, Kowloon, Hong Kong (McKay, M.) \|\| DEIS, CSITECNR, University of Bologna, V. le Risorgimento 2, 40136 Bologna, Italy (Giorgetti, A.; Chiani, M.) \|\| Department of Electrical and Computer Engineering, University of Canterbury, Christchurch, New Zealand (Smith, P.)
Abstract	The rates of change of a wide variety of MIMO metrics are evaluated by differentiating the relevant random processes. Moments, distributions and simplified representations are derived where possible for the resulting derivatives. Fundamental metrics such as the channel coefficients, channel correlation matrices and eigenvalues are considered in addition to performance metrics such as bit-error-rate and the condition number. The analysis presents a comprehensive framework for studying the time-varying nature of MIMO systems in independent Rayleigh fading and leads to insights into the relative rates of change of the various metrics. For example, we show that there is a difference of several orders of magnitude between the moderate rates of change of channel elements and eigenvalues and the extremely rapid variations of the channel condition number. The channel eigenvectors are also shown to experience rapid fluctuations.
Starting Page	194
Ending Page	199
File Size	553133
Page Count	6
File Format	PDF
ISBN	9781424459995
e-ISBN	9781424460014
DOI	10.1109/EW.2010.5483415
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-04-12
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Measurement Fluctuations Time varying systems System performance Bit error rate Channel estimation Rayleigh channels MIMO Eigenvalues and eigenfunctions Random processes
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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