NDLI: Comparison of characterization methods for statistical analysis of SoC designs

Content Provider	IEEE Xplore Digital Library
Author	Wook Kim Dai Joon Hyun Young Hwan Kim Kyung Tae Do
Copyright Year	2008
Description	Author affiliation: Div. of Electr. & Comput. Eng., Pohang Univ. of Sci. & Technol., Pohang (Wook Kim; Dai Joon Hyun; Young Hwan Kim)
Abstract	This paper compares characteristics and performances of characterization methods for statistical timing analysis and statistical leakage estimation. Two popular characterization methods, regular grid sampling and distribution based sampling are selected and their features, advantages and disadvantages are discussed. The experimental results performed with ISCAS benchmark circuits showed the accuracy of using two methods in statistical analysis. In statistical timing analysis, distribution based sampling, which is good approach when the variation is not large, shows good performance in terms of accuracy. However, in statistical leakage estimation, regular grid sampling, which is superior when the variation is very large, shows good performance.
Starting Page	789
Ending Page	792
File Size	415864
Page Count	4
File Format	PDF
ISBN	9781424421015
DOI	10.1109/ECTICON.2008.4600549
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-14
Publisher Place	Thailand
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Analytical models Accuracy Statistical analysis Estimation Leakage current Timing Delay
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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