NDLI: Cleansing Test Suites from Coincidental Correctness to Enhance Fault-Localization

Content Provider	IEEE Xplore Digital Library
Author	Masri, W. Assi, R.A.
Copyright Year	2010
Abstract	Researchers have argued that for failure to be observed the following three conditions must be met: 1) the defect is executed, 2) the program has transitioned into an infectious state, and 3) the infection has propagated to the output. Coincidental correctness arises when the program produces the correct output, while conditions 1) and 2) are met but not 3). In previous work, we showed that coincidental correctness is prevalent and demonstrated that it is a safety reducing factor for coverage-based fault localization. This work aims at cleansing test suites from coincidental correctness to enhance fault localization. Specifically, given a test suite in which each test has been classified as failing or passing, we present three variations of a technique that identify the subset of passing tests that are likely to be coincidentally correct. We evaluated the effectiveness of our techniques by empirically quantifying the following: 1) how accurately did they identify the coincidentally correct tests, 2) how much did they improve the effectiveness of coverage-based fault localization, and 3) how much did coverage decrease as a result of applying them. Using our better performing technique and configuration, the safety and precision of fault-localization was improved for 88% and 61% of the programs, respectively.
Starting Page	165
Ending Page	174
File Size	580601
Page Count	10
File Format	PDF
ISBN	9781424464357
e-ISBN	9781424464364
DOI	10.1109/ICST.2010.22
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-04-06
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software testing Fault diagnosis Computer science Degradation Java Sufficient conditions coincidental correctness software testing fault localization Safety
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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