NDLI: Taming coincidental correctness: Coverage refinement with context patterns to improve fault localization

Content Provider	IEEE Xplore Digital Library
Author	Xinming Wang Cheung, S.C. Chan, W.K. Zhenyu Zhang
Copyright Year	2009
Description	Author affiliation: Dept. of Comp. Sci., HKU, China (Zhenyu Zhang) \|\| Dept. of Comp. Sci. & Eng., HKUST, China (Xinming Wang; Cheung, S.C.) \|\| Dept. of Comp. Sci., City Univ. of Hong Kong, China (Chan, W.K.)
Abstract	Recent techniques for fault localization leverage code coverage to address the high cost problem of debugging. These techniques exploit the correlations between program failures and the coverage of program entities as the clue in locating faults. Experimental evidence shows that the effectiveness of these techniques can be affected adversely by coincidental correctness, which occurs when a fault is executed but no failure is detected. In this paper, we propose an approach to address this problem. We refine code coverage of test runs using control- and data-flow patterns prescribed by different fault types. We conjecture that this extra information, which we call context patterns, can strengthen the correlations between program failures and the coverage of faulty program entities, making it easier for fault localization techniques to locate the faults. To evaluate the proposed approach, we have conducted a mutation analysis on three real world programs and cross-validated the results with real faults. The experimental results consistently show that coverage refinement is effective in easing the coincidental correctness problem in fault localization techniques.
Starting Page	45
Ending Page	55
File Size	402322
Page Count	11
File Format	PDF
ISBN	9781424434534
ISSN	02705257
DOI	10.1109/ICSE.2009.5070507
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-05-16
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Debugging Fault detection Cities and towns Costs Genetic mutations Software maintenance Councils Fault diagnosis
Content Type	Text
Resource Type	Article
Subject	Software

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Taming coincidental correctness: Coverage refinement with context patterns to improve fault localization

Taming coincidental correctness: coverage refinement with context to improve fault localization (2009)

Using Cluster Analysis to Identify Coincidental Correctness in Fault Localization

Mitigating the Effect of Coincidental Correctness in Spectrum Based Fault Localization

Regression Identification of Coincidental Correctness via Weighted Clustering

Cleansing Test Suites from Coincidental Correctness to Enhance Fault-Localization

Enhancing Fault Localization via Multivariate Visualization

Effect of test set size and block coverage on the fault detection effectiveness

Adding context to fault localization with integration coverage

Taming coincidental correctness: Coverage refinement with context patterns to improve fault localization

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