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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xiang He Fritz, T.A. Knepper, R.W. Mavretic, A. |
| Copyright Year | 2013 |
| Abstract | The design, fabrication, and test results of a multi-channel integrated readout circuit (MIROC) mixed-signal ASIC for low capacitance (<;10pF) solid state sensors arrays are presented in this publication. The chip, fabricated in IBM 0.18 μm 7WL SiGe BiCMOS technology and measuring 4 × 4 mm, contains nineteen analog amplifier channels with pulse-shaping and peak-and-hold detection, three on-chip 8-bit hybrid ADCs, each equipped with an 8-bit parallel-to-serial shift register, and digital control logic for routing any of the channels with a hit to any available ADC. As a highly integrated system requiring minimal external controls, the chip was designed with the intention of significantly reducing cost, volume, power, and mass of the readout system for related applications, and consequently should reduce the development cycle of new instruments. MIROC has a FWHM noise below 20keV. Each channel contains four configurable conversion gain levels, measured to be 3.73mV/fC, 8.59mV/fC, 13.89mV/fC and 21.59mV/fC. In case of silicon detectors, the chip is capable of studying energetic charged particles over the range from 100keV to 6MeV. Measured test results and key characteristics are presented in the paper. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 529982 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781467344777 |
| e-ISBN | 9782355000263 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-04-16 |
| Publisher Place | Spain |
| Access Restriction | Subscribed |
| Rights Holder | CMP |
| Subject Keyword | ADC Semiconductor device measurement Peak Tracking and Hold Circuit Noise Charged Particle Detector Linearity Logic gates Pulse Shaping and Measurements Capacitance Charge Sensitive Amplifier Sensor arrays |
| Content Type | Text |
| Resource Type | Article |
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