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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xiaoxin Shang Veldhuis, R.N.J. |
| Copyright Year | 2007 |
| Description | Author affiliation: Univ. of Twente, Enschede (Xiaoxin Shang; Veldhuis, R.N.J.) |
| Abstract | In a biometric verification system of a smart gun, the rightful user is recognized based on his hand-pressure pattern. The main factor which affects the verification performance of this system is the variation between the probe image and the gallery image of a subject, in particular when the probe and the gallery images have been recorded with a few weeks in between. One of the major variations is in the pressure distribution of images. In this work, we propose a novel preprocessing technique, Local Absolute Binary Patterns, prior to grip-pattern classification. With respect to a certain pixel in an image, Local Absolute Binary Patterns processing quantifies how its neighboring pixels are fluctuating. It will be shown that this technique can both reduce the variation of pressure distribution, and extract information of the hand shape in the image. Therefore, a significant improvement of the verification result has been achieved. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 11210623 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424415960 |
| DOI | 10.1109/BTAS.2007.4401939 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-09-27 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Biometrics Image recognition Shape Fingers Prototypes Pattern recognition Data mining Probes Pixel Testing |
| Content Type | Text |
| Resource Type | Article |
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