NDLI: Planning of truncated sequential binomial tests via the ASN-increase parameter

Content Provider	IEEE Xplore Digital Library
Author	Michlin, Y.H. Shaham, O.
Copyright Year	2009
Description	Author affiliation: Technion - Israel Institute of Technology, Faculty of Industrial Engineering & Management, Haifa, 32000 Israel (Michlin, Y.H.) \|\| RAFAEL - Advanced Defense Systems Ltd, Microelectronics Directorate, P.O. Box 2250, Haifa 31021, Israel (Shaham, O.)
Abstract	The Sequential Probability Ratio Test (SPRT) is the most common acceptance test in the field of reliability and quality control of electronic systems. Proposed are measures of the test quality. One of them is the increase in the Average Sample Number (ASN) caused by the test truncation. An optimality criterion based on it considerably facilitates solution of the problems in automatic planning of the test. Also given are formulas for determining one of the parameters of the test boundaries — the Truncation Apex (TA), depending on the required test characteristics. A user's algorithm for the planner is also included.
Starting Page	1
Ending Page	5
File Size	274881
Page Count	5
File Format	PDF
ISBN	9781424439850
DOI	10.1109/COMCAS.2009.5386017
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-11-09
Publisher Place	Israel
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Binomial test Industrial relations test truncation Electronic equipment testing reliability Industrial engineering Microelectronics Technology planning sequential testing Sequential analysis Technology management Engineering management Quality control
Content Type	Text
Resource Type	Article

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