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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Steinhurst, J. Lastra, A. |
| Copyright Year | 2006 |
| Description | Author affiliation: Dept. of Comput. Sci., North Carolina Univ., Chapel Hill, NC (Steinhurst, J.; Lastra, A.) |
| Abstract | Importance sampling reduces the variance of Monte Carlo integration by focusing effort on the directions that contribute the most energy to the result. In this paper we present a computationally efficient global importance-sampling strategy. Final gather rays are generated in proportion to the product of all three factors of the rendering equation integrand: surface reflectance, incident radiance, and the cosine term. By focusing effort on those directions that contribute the most energy to the result, the variance is greatly reduced. To be suitable for an interactive system, the computational cost of generating samples and their associated probabilities must be low. Our method requires neither that the surface reflectance function be invertible, nor that an expensive calculation be performed after ray selection to evaluate the p.d.f. Building on Henrik Jensen's work, we use a photon map to estimate incident radiance. In this paper, we also use the photon map to render the final image. We compare our method to previous methods and conclude that our technique exhibits competitive variance reduction while requiring one fiftieth of the computation |
| Starting Page | 133 |
| Ending Page | 138 |
| File Size | 512915 |
| Page Count | 6 |
| File Format | |
| ISBN | 1424406935 |
| DOI | 10.1109/RT.2006.280224 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-09-18 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Ray Tracing Interactive Rendering Global illumination Photonics Reflectivity Computer science Photon Mapping Monte Carlo methods Interactive systems Layout Importance Sampling Lighting Image generation Bidirectional control Ray tracing |
| Content Type | Text |
| Resource Type | Article |
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