NDLI: A study relating image sampling rate and image pattern recognition

Content Provider	IEEE Xplore Digital Library
Author	Srikantan, G. Srihari, S.N.
Copyright Year	1994
Description	Author affiliation: CEDAR, Amherst, NY, USA (Srikantan, G.; Srihari, S.N.)
Abstract	The trade-off between the granularity of the data representation and the recognition accuracy is examined in this paper. We show that unless a particular criterion is satisfied, there is no guarantee of achieving a prescribed recognition accuracy. This criterion of interest, is the mutual information content between the measurements and the class identities. A novel method for the objective evaluation of intrinsic error in recognition as sampling rate varies, is described. This approach is general enough to permit the evaluation of error even when the parameter under study takes a different form. To demonstrate this we present results in feature subset selection and multiple classifier combination. In the case of feature selection, the measurements are the features. In the case of multiple classifier combination it is the "quality" of the individual classifiers, evalulated based on the mutual information between the classifier parameters and class identities.<>
Starting Page	709
Ending Page	712
File Size	332798
Page Count	4
File Format	PDF
ISBN	0818658258
ISSN	10636919
DOI	10.1109/CVPR.1994.323884
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-06-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Image sampling Data structures Feature extraction Pattern recognition
Content Type	Text
Resource Type	Article
Subject	Computer Vision and Pattern Recognition Software

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