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Content Provider | IEEE Xplore Digital Library |
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Author | Xi, Dongmiao Sun, Yankui Miao, Jinghua Wang, Yongge |
Copyright Year | 2015 |
Description | Author affiliation: School of Mathematics and Systems Science, Beihang University, Beijing, China (Xi, Dongmiao; Wang, Yongge) || Department of Computer Science and Technology, Tsinghua University, Beijing, China (Sun, Yankui; Miao, Jinghua) |
Abstract | A novel scheme to calculate feature descriptors with rotation invariance was proposed in this paper. Unlike traditional methods of computing feature orientations and descriptors using a single sampling pattern, we calculate the orientation of a feature point with one sampling pattern and generate its descriptor with another one. Based on this idea, we present a method to generate a rotation invariant descriptor using the sampling patterns of FREAK and BRIEF. The experimental results on image matching show that our method is not only invariant to image rotation but also robust to many other situations such as image blur, viewpoint change, illumination change and JEPG compression. At the same time, the proposed method performs competitively with BRISK and FREAK in computational time. |
Starting Page | 584 |
Ending Page | 588 |
File Size | 1259932 |
Page Count | 5 |
File Format | |
e-ISBN | 9781467390989 |
DOI | 10.1109/CISP.2015.7407946 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2015-10-14 |
Publisher Place | China |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | rotation invariance Image coding Image matching feature descriptor Lighting Signal processing algorithms Detectors sampling pattern Feature extraction Robustness |
Content Type | Text |
Resource Type | Article |
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