NDLI: Buskeeper PUFs, a promising alternative to D Flip-Flop PUFs

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Buskeeper PUFs, a promising alternative to D Flip-Flop PUFs

Content Provider	IEEE Xplore Digital Library
Author	Simons, P. van der Sluis, E. van der Leest, V.
Copyright Year	2012
Description	Author affiliation: Intrinsic-ID, Eindhoven, The Netherlands (Simons, P.; van der Sluis, E.; van der Leest, V.)
Abstract	Cloning, theft of service and tampering have become serious threats on the revenue and reputation of hardware vendors. To protect their products against these attacks hardware security, based on cryptographic primitives using keys, can be used. These keys are usually stored somewhere in the hardware, so the strength of the security depends on the effort required from attackers to compromise them. Tools for attacking hardware have become very advanced, which has decreased the protection provided by storing a key in memory to a minimum. To protect devices against attacks on their keys, Physically Unclonable Functions (PUFs) can be used. PUFs are primitives that extract secrets from physical characteristics of integrated circuits (ICs) and can be used, amongst others, for secure key storage. This paper introduces a new type of PUF, the Buskeeper. In our study this new type of PUF is evaluated on the properties of reliability and uniqueness. For this purpose several tests have been performed in order to compare the results of Buskeeper PUFs to those of D Flip-Flop (DFF) PUFs from [4] and [14]. This comparison shows that the Buskeeper PUF performs as well as, if not better than, this (already known and generally accepted) PUF type. Since Buskeepers are much more efficient than DFFs in regard to the amount of hardware resources required, we conclude that the Buskeeper PUF is a viable (and probably preferable) alternative to DFF PUFs.
Starting Page	7
Ending Page	12
File Size	802642
Page Count	6
File Format	PDF
ISBN	9781467323413
e-ISBN	9781467323406
DOI	10.1109/HST.2012.6224311
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Voltage measurement Aging Entropy Iron Hardware Reliability
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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