NDLI: A Complete Emulation System for Single Event Effects Analysis

Content Provider	IEEE Xplore Digital Library
Author	Napoles, J. Guzman-Miranda, H. Aguirre, M. Tombs, J.N. Mogollon, J.M. Palomo, R. Vega-Leal, A.P.
Copyright Year	2008
Description	Author affiliation: Dept. of Electron. Eng., Univ. of Seville, Seville (Napoles, J.; Guzman-Miranda, H.; Aguirre, M.; Tombs, J.N.; Mogollon, J.M.; Palomo, R.; Vega-Leal, A.P.)
Abstract	Trends show that next coming technologies will produce new generations of very large circuits, running at high clock rates. Some critical applications will have to be protected against the remaining radiation at sea level. This is especially important in aerospace applications because ionizing radiation produces corruption of the internal state. New design methods have to be introduced to assure circuits will tolerate the impact of single event effects (SEE). It is very important to be able to analyze which parts of the circuits are more critical and how the behavior of the global system is degraded when one part suffers a SEE. This paper presents the last functionalities added to the FT-UNSHADES system to extend the analysis to SETs and MBUs. As a result, the system can insert and analyze many fault types at a rate of 180 K faults per hour in a system with 2 million test vectors.
Starting Page	213
Ending Page	216
File Size	4795629
Page Count	4
File Format	PDF
ISBN	9781424419920
DOI	10.1109/SPL.2008.4547760
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-03-26
Publisher Place	Argentina
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Single event upset Space technology Emulation Redundancy Very large scale integration Hardware Combinational circuits Circuit faults Flip-flops
Content Type	Text
Resource Type	Article

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