NDLI: On the interaction between the DUT’s radar cross section and the reactive effect of TEM cells

Content Provider	IEEE Xplore Digital Library
Author	Pouhe, David Monich, Gerhard
Copyright Year	2007
Description	Author affiliation: Technical University Berlin, Einsteinufer 25, 10587 Berlin, Germany (Pouhe, David; Monich, Gerhard)
Abstract	A simple novel approach for an efficient investigation of the interactions between the DUT and the cell is provided. Closed-form expressions for the reflection coefficient, the relative deviation in field and the relative error in induced current caused by the reactive effect of the cell are derived. Each of these expressions encompasses both the mutual influence of the DUT’s RCS and the reactive effect of the cell. It is shown that, depending on the frequency dependent phase factor $e^{jͨ},$ strong and weak test conditions may occur since the overall incident field will exhibit maxima and minima. Hence evidence showing that the total incident field impinging on the DUT generally deviates from the primary excited TEM field is provided.
Starting Page	413
Ending Page	416
File Size	257444
Page Count	4
File Format	PDF
ISBN	9783952328613
DOI	10.1109/EMCZUR.2007.4388283
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-09-24
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	EMC Zurich
Subject Keyword	Radar cross section Frequency dependence Shape Lighting Closed-form solution Electromagnetic compatibility Reflection TEM cells Testing Propagation delay
Content Type	Text
Resource Type	Article

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On the interaction between the DUT’s radar cross section and the reactive effect of TEM cells