NDLI: Overview of thermal studies on photonics devices for reliability, robustness and new design

Content Provider	IEEE Xplore Digital Library
Author	Deshayes, Y. Royon, A. Baillot, R. Bechou, L. Canioni, L. Petit, Y. Cardinal, T. Bord, I. Levrier, B. Ousten, Y.
Copyright Year	2012
Description	Author affiliation: Eurelnet, University Bordeaux 1, ADERA, 351 cours de la Libération, 33405, TALENCE Cedex 5, France (Levrier, B.) \|\| IMS Laboratory, University Bordeaux I-ENSEIRB-CNRS UMR 5218, 351 cours de la Libération, 33405, TALENCE Cedex 5, France (Deshayes, Y.; Baillot, R.; Bechou, L.; Bord, I.; Ousten, Y.) \|\| LOMA, University Bordeaux 1, CNRS UMR 5798, 351 cours de la Libération, 33405, TALENCE Cedex 5, France (Royon, A.; Canioni, L.) \|\| ICMCB, University Bordeaux 1, CNRS UPR 9048, 87, Avenue du Docteur Schweitzer, 33608 PESSAC cedex, France (Petit, Y.; Cardinal, T.)
Abstract	This paper presents the main activities on reliability, robustness and failure of photonic devices. The approach is different if the system is manufactured of if it is developed or elaborated. The building reliability is exposed on the new photonic devices using for future numerical data storage for archiving. The robustness is deal with the laser transmitter in marketing position. Finely, the blue light emitting diode is treated with operational reliability. This paper has a main line on the model and measurement of thermal flow or temperature. Since 10 years and actually, the thermal flow is the main cause of degradation of photonic devices. But, additionally, in comparison with electronic devices, the light is the new parameter to take into account in the failure degradation. The blue light interaction with material, especially polymer, is important and the modification of fluorescence change can change function of the photonic devices. This paper underlines the kind of problems.
Starting Page	1
Ending Page	6
File Size	869020
Page Count	6
File Format	PDF
ISBN	9781467318822
e-ISBN	9782355000232
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-09-25
Publisher Place	Hungary
Access Restriction	Subscribed
Rights Holder	CMP
Subject Keyword	Welding Measurement by laser beam Glass Fluorescence Aging Ultrafast optics Stress
Content Type	Text
Resource Type	Article

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