NDLI: Low-cost test of the first-order Delta-Sigma converter

Content Provider	IEEE Xplore Digital Library
Author	Desouky, A.O. Khairy, M.S. Abdelhalim, M.B. Amer, H.H.
Copyright Year	2009
Description	Author affiliation: College of Computing and Information Technology (CCIT), Arab Academy for Science, Technology and Maritime Transport (AASTMT), Cairo, Egypt (Abdelhalim, M.B.) \|\| Electronics and Communications Department - Faculty of Engineering, Cairo University, Giza, Egypt (Desouky, A.O.) \|\| Electronics Engineering Department, American University in Cairo, 113 Kasr El Aini, 11511, Egypt (Amer, H.H.) \|\| University of California, Irvine, U.S.A (Khairy, M.S.)
Abstract	Delta-Sigma converters are very popular components in the field of mixed-signal circuits. Hence, testing these converters is a very crucial issue. This paper discusses testing first-order Delta-Sigma A/D converters. It is shown that one analog test value is enough to detect all faults (but one) in the target fault set. The target fault set consists of stuck-at-faults in digital components, op-amp output faults, as well as open and short faults in passive components. Analytical results were verified by ORCAD PSPICE simulations.
Starting Page	100
Ending Page	105
File Size	201298
Page Count	6
File Format	PDF
ISBN	9781424458424
DOI	10.1109/ICCES.2009.5383302
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-12-14
Publisher Place	Egypt
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Resistors mixed-signal testing Circuit simulation Delta-Sigma A/D Converters Vectors fault coverage Circuit faults Circuit testing Analog-digital conversion Pulse width modulation converters fault models Fault detection SPICE Signal generators
Content Type	Text
Resource Type	Article

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