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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bowser, J. Young, W. Lei Chen Luciani, V. |
| Copyright Year | 2012 |
| Abstract | Phosphine gas is widely used as the phosphorus source for the deposition of in-situ doped n-type polysilicon. Typically, high pressure bottled phosphine gas is used for this purpose with excellent results. However, the safe use of a pressurized gaseous phosphine source requires a remote gas cabinet in a suitable location, double walled stainless steel tubing, and multiple toxic gas sensing points. The cost of this infrastructure can be prohibitive for many research laboratories. As a safe means around this cost issue, we have successfully implemented a commercially available phosphine SADS as the dopant source for in situ doped polysilicon. SADS has been proven as a safer source and can be installed locally, inside the source cabinet attached to the LPCVD furnace stack meeting all semiconductor industry safety requirements [1]. Based on the enhanced safety and reduced infrastructure requirements, we implemented SADS in the CNST NanoFab LPCVD system. |
| Starting Page | 1 |
| Ending Page | 1 |
| File Size | 110814 |
| Page Count | 1 |
| File Format | |
| ISBN | 9781457717512 |
| ISSN | 07496877 |
| e-ISBN | 9781457717529 |
| e-ISBN | 9781457717505 |
| DOI | 10.1109/UGIM.2012.6247086 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-07-09 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Furnaces Safety Electronics industry Fluid flow Films Chemical vapor deposition Nanoscale devices |
| Content Type | Text |
| Resource Type | Article |
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