NDLI: A minimal diffraction cut of quartz for high performance SAW filters

Content Provider	IEEE Xplore Digital Library
Author	Abbott, B.P. Solie, L.
Copyright Year	2000
Description	Author affiliation: Sawtek Inc., Apopka, FL, USA (Abbott, B.P.)
Abstract	Diffraction has long been a limiting factor in implementing high performance SAW filters on ST-quartz. A minimal diffraction Quartz cut would find significant interest in the SAW industry. By proper selection of the Euler angles, the effects of diffraction may be minimized while simultaneously maintaining near zero power flow angle (PFA) and temperature coefficient of frequency (TCF). Using this approach, a new orientation of quartz has been identified. The resulting optimal region of Euler angles is (-5/spl deg/ to +5/spl deg/, 37/spl deg/ to 46/spl deg/, 20/spl deg/ to 26/spl deg/). Doubly rotated wafers can introduce additional significant variations in the manufacture of SAW devices. Therefore a more restricted, but potentially more useful, range of Euler angles is (0/spl deg/, 40/spl deg/ to 46/spl deg/, 20/spl deg/ to 26/spl deg/). A nominal solution is (0/spl deg/, 43/spl deg/, 23.7/spl deg/) Over this range the coupling coefficient is approximately 15% greater than that of ST-quartz. Therefore, while maintaining near zero PFA and room temperature TCF, and slightly improved coupling, the effects of diffraction have been dramatically reduced. The theoretical background and experimental results of this development are presented. Additionally, a comparison of a SAW filter fabricated on ST-quartz and the new minimal diffraction orientation is presented.
Starting Page	235
Ending Page	240
File Size	3907877
Page Count	6
File Format	PDF
ISBN	0780363655
ISSN	10510117
DOI	10.1109/ULTSYM.2000.922547
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-10-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Diffraction SAW filters Surface acoustic waves Temperature Load flow Computer errors Frequency Manufacturing Surface acoustic wave devices Communication industry
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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