NDLI: Optical mapping of surface vibrations on a thin-film resonator near 2 GHz

Content Provider	IEEE Xplore Digital Library
Author	Graebner, J.E. Safar, H.F. Barber, B. Gammel, P.L. Herbsommer, G.J. Fetter, L.A. Pastalan, J. Huggins, H.A. Miller, R.E.
Copyright Year	2000
Description	Author affiliation: Lucent Technol. Bell Labs., Murray Hill, NJ, USA (Graebner, J.E.)
Abstract	An optical scanning interferometer is used to examine the mode structure of a solidly-mounted thin-film resonator (TFR) when it is excited electrically in the neighborhood of its resonant frequency. Scans across the surface with <1 /spl mu/m lateral resolution and 0.3 pm (0.003 Angstrom) vertical resolution reveal a rich spectrum of modes. At the mechanical resonance a uniform up-and-down motion is observed, while at slightly higher frequencies near the pole frequency the mode pattern breaks up into standing waves with wavelengths ranging from 10-100 /spl mu/m. A second set of standing waves with discrete wavelengths in the range 2-5 /spl mu/m and with random orientation is observed over a broader frequency range. Semi-quantitative agreement is found between the data and the dispersion curves calculated with a transfer matrix technique for the multilayer waveguide structure of the TFR.
Starting Page	635
Ending Page	638
File Size	3888038
Page Count	4
File Format	PDF
ISBN	0780363655
ISSN	10510117
DOI	10.1109/ULTSYM.2000.922628
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-10-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical resonators Optical films Optical interferometry Optical surface waves Vibrations Resonant frequency Resonance Transmission line matrix methods Nonhomogeneous media Optical waveguides
Content Type	Text
Resource Type	Article

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