NDLI: Novel techniques for improving testability analysis

Content Provider	IEEE Xplore Digital Library
Author	Yin-He Su Ching-Hwa Cheng Shih-Chieh Chang
Copyright Year	2000
Description	Author affiliation: Dept. of Comput. Sci. & Inf. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan (Yin-He Su)
Abstract	The purpose of a testability analysis program is to estimate the difficulty of testing a fault. A good measurement can give an early warning about the testing problem so as to provide guidance in improving the testability of a circuit. There have been researches attempting to efficiently compute the testability analysis. Among those, the Controllability and Observability Procedure COP (1984) can calculate the testability value of a stuck-at fault efficiently in a tree-structured circuit but may be very inaccurate for a general circuit. The inaccuracy in COP is due to the ignorance of signal correlations. The algorithm of TAIR (Testability Analysis by Implication Reasoning) proposes a testability analysis algorithm, which starts from the result of COP and then gradually improves the result by applying a set of rules. The set of rules in TAIR can capture some signal correlations and therefore the results of TAIR are more accurate than COP. In this paper, we first prove that the rules in TAIR can be replaced by a closed-form formulation. Then, based on the closed-form formulation, we proposed two novel techniques to further improve the testability analysis results. Our experimental results have shown improvement over the results of TAIR.
Starting Page	392
Ending Page	397
File Size	570024
Page Count	6
File Format	PDF
ISBN	0769508871
ISSN	10817735
DOI	10.1109/ATS.2000.893655
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-12-06
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Circuit faults Observability Controllability Built-in self-test Fault detection Algorithm design and analysis Automatic testing Wire Computer science
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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