NDLI: March-based RAM diagnosis algorithms for stuck-at and coupling faults

Content Provider	IEEE Xplore Digital Library
Author	Jin-Fu Li Kuo-Liang Cheng Chih-Tsun Huang Cheng-Wen Wu
Copyright Year	2001
Description	Author affiliation: Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan (Jin-Fu Li)
Abstract	Diagnosis technique plays a key role during the rapid development of the semiconductor memories, for catching the design and manufacturing failures and improving the overall yield and quality. Investigation on efficient diagnosis algorithms is very important due to the expensive and complex fault/failure analysis process. We propose March-based RAM diagnosis algorithms which not only locate faulty cells but also identify their types. The diagnosis complexity is O(17N) and O((17+10B)N) for bit-oriented and word-oriented diagnosis algorithms, respectively, where N represents the address number and B is the data width. Using the proposed algorithms, stuck at faults, state coupling faults, idempotent coupling faults and inversion coupling faults can be distinguished. Furthermore, the coupled and coupling cells can be located in the memory array. Our word-oriented diagnosis algorithm can distinguish all of the inter-word and intra-word coupling faults, and locate the coupling cells of the intra-word inversion and idempotent coupling faults. With additional 2B-1 operations, the algorithm can further locate the intra-word state coupling faults. With improved diagnostic resolution and test time, the proposed algorithms facilitate the development and manufacturing of semiconductor memories.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council
Starting Page	758
Ending Page	767
File Size	921627
Page Count	10
File Format	PDF
ISBN	0780371690
ISSN	10893539
DOI	10.1109/TEST.2001.966697
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-11-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Testing Fault location Read-write memory Semiconductor memory Semiconductor device manufacture Algorithm design and analysis Random access memory Laboratories Semiconductor device reliability
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

March SS: a test for all static simple RAM faults

Fault coverage analysis of RAM test algorithms

A March-Based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories

Minimal March-Based Fault Location Algorithm with Partial Diagnosis for All Static Faults in Random Access Memories

A March-based fault location algorithm for static random access memories

A March-based fault location algorithm for static random access memories

Multi Background Memory Testing

An optimal march test for locating faults in DRAMs

Memory fault diagnosis by syndrome compression

March-based RAM diagnosis algorithms for stuck-at and coupling faults

Similar Documents

March SS: a test for all static simple RAM faults

Fault coverage analysis of RAM test algorithms

A March-Based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories

Minimal March-Based Fault Location Algorithm with Partial Diagnosis for All Static Faults in Random Access Memories

A March-based fault location algorithm for static random access memories

A March-based fault location algorithm for static random access memories

Multi Background Memory Testing

An optimal march test for locating faults in DRAMs

Memory fault diagnosis by syndrome compression

March-based RAM diagnosis algorithms for stuck-at and coupling faults