NDLI: A highly-efficient transparent online memory test

Content Provider	IEEE Xplore Digital Library
Author	Thaller, K.
Copyright Year	2001
Description	Author affiliation: Vienna Univ. of Technol., Austria (Thaller, K.)
Abstract	The transparent online memory test (TOMT) proposed in this paper has been specifically developed for online testing of word-oriented memories with parity or Hamming code protection. Using a rotated address sequence the algorithm passes four times through the whole address space and performs embedded march tests for every word. The careful interleaving of word-oriented and bit-oriented test allows one to attain a fault coverage and a test duration comparable to the widely used March C- algorithm. The proposed memory test detects all stuck-at faults, all transition faults, all address decoder faults (even stuck-open address decoder faults), all single coupling faults (CFs, even write and read disturb CFs) and a reasonable percentage of linked CFs. Nevertheless, the algorithm is suitable for online use and can be implemented in hardware with moderate effort.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council
Starting Page	230
Ending Page	239
File Size	905266
Page Count	10
File Format	PDF
ISBN	0780371690
ISSN	10893539
DOI	10.1109/TEST.2001.966638
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-11-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault detection Decoding Automatic testing Protection Space technology Performance evaluation Fault tolerant systems Read-write memory Hardware Electronic components
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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