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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gafoor, S.A. Ramana Rao, P.V. |
| Copyright Year | 2006 |
| Description | Author affiliation: Electr. Eng. Dept., Nat. Inst. of Technol., Warangal (Gafoor, S.A.; Ramana Rao, P.V.) |
| Abstract | This paper deals with application of wavelet transform for detection of busbar faults and to discriminate them from external faults. The detail coefficients of differential current and those of a source CT current are obtained over a narrow moving window. The fault indexes of both current signals obtained are compared with their respective threshold values to detect the internal faults. In the event of external faults the d-coefficients of differential current have a time shift compared to that of source current due to saturation of CT and this is used to discriminate the external faults from internal faults. The scheme is tested for different types of external and internal faults with variations in incidence angles and fault impedances. The proposed scheme is proved to be fast, stable and reliable in detecting the internal faults and discriminating them from external faults |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 3673825 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424405483 |
| DOI | 10.1109/TENCON.2006.344205 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-11-14 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Wavelet transforms Power system protection Fault currents Circuit faults Power system transients Frequency Power system stability Fault detection Wavelet analysis Transient analysis |
| Content Type | Text |
| Resource Type | Article |
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