NDLI: Defect Tolerance of an Optically Reconfigurable Gate Array with a One-time Writable Volume Holographic Memory

Content Provider	IEEE Xplore Digital Library
Author	Mabuchi, T. Miyashiro, K. Watanabe, M. Ogiwara, A.
Copyright Year	2009
Abstract	Optically reconfigurable gate arrays (ORGAs) have been developed as a type of multi-context field programmable gate array to realize fast reconfiguration and numerous reconfiguration contexts. Along with such advantages, ORGAs have high defect tolerance. They consist simply of a holographic memory, a laser diode array, and a gate array VLSI. Even if a gate array VLSI includes defective areas, the ORGAs capability of perfectly parallel programmability enables avoidance of those defective areas through alternative use of other non-defective areas. Moreover, a holographic memory to store contexts is known to have high defect tolerance because each bit of a reconfiguration context can be generated from the entire holographic memory.Consequently, damage of a holographic memory rarely affects its diffraction pattern or a reconfiguration context. For that reason, ORGAs are extremely robust against component defects in devices such as a laser array, a gate array, and a holographic memory, and are particularly useful for space applications, which require high reliability.This paper presents experimentation related to the defect tolerance of new optically reconfigurable gate array with a one-time easily writable volume holographic memory.
Starting Page	106
Ending Page	111
File Size	742341
Page Count	6
File Format	PDF
ISBN	9780769537146
DOI	10.1109/AHS.2009.62
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-07-29
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Holography Optical arrays Holographic optical components Field programmable gate arrays Semiconductor laser arrays Very large scale integration Diode lasers Diffraction Ultraviolet sources Robustness Single Event Upsets Field Programmable Gate Arrays Optically Reconfigurable Gate Arrays Triple Module Redundancy
Content Type	Text
Resource Type	Article

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