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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Qingyou Zhu CiYong Luo ZhanLong Zhong MinYou Chen |
| Copyright Year | 2008 |
| Description | Author affiliation: Dept. of physic & Electron. Inf. Eng., Yangtze Normal Univ., Fuling (Qingyou Zhu) || State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Electr. Eng. of Chongqing Univ., Chongqing (CiYong Luo; ZhanLong Zhong; MinYou Chen) |
| Abstract | The dynamic algorithm of back-projection has been widely used in electrical impedance tomography (EIT) systems due to its simplicity and feasibility. However, the impedance images produced by back-projection algorithm have some clear artefacts. A modified mean back-projection algorithm for reconstructing image in electrical impedance tomography by introducing the rough length of projection region is presented to reduce partial artefacts especially the asteroid trace. The realization and experiment verification of the algorithm have been conducted. Simulation experiments show that the artefacts in image reconstructed by mean back-projection algorithm are lower than that of back-projection algorithm, the modified mean back-projection algorithm is efficient and effective than back-projection algorithm. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 210956 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781889335384 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-09-28 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | TSI ENTERPRISES, INC. |
| Subject Keyword | Image reconstruction X-ray imaging Magnetic resonance imaging Computed tomography Ultrasonic imaging Back Impedance measurement Biomedical imaging Optical imaging Physics |
| Content Type | Text |
| Resource Type | Article |
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