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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yadin, E. Olmar, D. Oron, O. Nathansohn, R. |
| Copyright Year | 2008 |
| Description | Author affiliation: Elta Systerms Ltd., Ashdod (Yadin, E.; Olmar, D.; Oron, O.; Nathansohn, R.) |
| Abstract | Modern 2D spectral estimation techniques can be used for SAR imaging. The aim of those techniques is to improve the SAR image quality at the expense of an additional processing load. This paper focuses on applying the 2D minimum variance power spectrum estimation method (MVM) to SAR raw data. MVM process improves the image ISLR and reduces speckle noise. MVM was found to be particularly useful in SAR imaging geometries involving steep depression angles. Such geometries are characterized by high clutter interference, leading to poor contrasts between targets and the surrounding clutter. MVM process enhances the target to background contrast in such images. Parallel MVM process was demonstrated at Elta on a processing array. MVM images of 8000 by 8000 pixels are produced there in few minutes. Examples of MVM images are given and compared to conventional FFT based SAR images. Quantitative measures for ISLR improvement and speckle smoothening are given. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 1969112 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424415380 |
| ISSN | 10975659 |
| DOI | 10.1109/RADAR.2008.4720775 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-05-26 |
| Publisher Place | Italy |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Radar polarimetry Synthetic aperture radar Geometry Speckle Clutter Pixel Radar scattering Image quality Spectral analysis Noise reduction Spectral Estimation Techniques Synthetic Aperture Radar |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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