NDLI: Fifth order low-pass transitional Gm-C filter with relaxation oscillator frequency tuning circuit

Content Provider	IEEE Xplore Digital Library
Author	Teo, T.H. Khoo, E.-S. Uday, D.
Copyright Year	2003
Description	Author affiliation: Integrated Circuit & Syst. Lab., Inst. of Microelectron., Singapore, Singapore (Teo, T.H.; Khoo, E.-S.; Uday, D.)
Abstract	The design and implementation of gm-C filter with on-chip automatic tuning circuit is described. Transitional Bessel-Chebyshev filter is implemented to compromise between high attenuation and low group-delay variation. The circuit is fabricated with 0.18 /spl mu/m CMOS process with 6-metal single poly. The filter operates at a cutoff frequency of 10 MHz with a single 1.3 V supply voltage. The measurement results shows an attenuation of 70 dB at stop-band can be achieved, while keeping a low group-delay variation of less than 7 nSec up-to 1.5 times of cutoff frequency. The cutoff frequency can be linearly tuned from 4 MHz to 10 MHz through the tuning loop. By employing relaxation oscillator, accurate and robust frequency tuning scheme is implemented. Measured with sufficient samples, the frequency tuning circuit shows an cutoff frequency tuning error of less than 7.0% over wide range of supply voltages (1.3 V to 2.1 V) and operating temperatures (-40/spl deg/C to +85/spl deg/C) in the whole tuning range.
Sponsorship	IEEE Electron Devices Soc. IEEE Solid-State Circuits Soc. IEEE Hong Kong Section Hong Kong Univ. of Sci. and Technol. K.C. Wong Found. Fong's Family Found. Mr. Lim Por Yen
Starting Page	229
Ending Page	232
File Size	281095
Page Count	4
File Format	PDF
ISBN	0780377494
DOI	10.1109/EDSSC.2003.1283520
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-12-16
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Low pass filters Oscillators Circuit optimization Cutoff frequency Frequency measurement Tuning CMOS process Attenuation measurement Voltage measurement Robustness
Content Type	Text
Resource Type	Article

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