NDLI: Maximal diagnosis of interconnects of random access memories

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Maximal diagnosis of interconnects of random access memories

Content Provider	IEEE Xplore Digital Library
Author	Jun Zhao Meyer, F.J. Lombardi, F.
Copyright Year	1999
Description	Author affiliation: Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA (Jun Zhao)
Abstract	This paper presents an approach for the maximal diagnosis of all faults (stuck-at, open and short) in the interconnect of a random access memory (RAM); the interconnect includes data and address lines. This approach accomplishes maximal diagnosis under a complex model in which the lines in the interconnect of the RAM are involved in multiple faults simultaneously. The proposed algorithm (referred to as the Improved Maximal Diagnosis Algorithm, or IMDA) requires max{n,m-I}+n+3 WRITE and max{n,m}+2n READ, where n is the number of address lines and m is the number of data lines.
Starting Page	378
Ending Page	383
File Size	103545
Page Count	6
File Format	PDF
ISBN	076950146X
ISSN	10930167
DOI	10.1109/VTEST.1999.766692
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-04-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Random access memory Read-write memory System testing Electronic switching systems Computer science Assembly systems Manufacturing Test pattern generators Fault detection
Content Type	Text
Resource Type	Article

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