NDLI: An 88dB SNR, 30µm pixel pitch Infra-Red image sensor with a 2-step 16 bit A/D conversion

Content Provider	IEEE Xplore Digital Library
Author	Peizerat, A. Rostaing, J. Zitouni, N. Baier, N. Guellec, F. Jalby, R. Tchagaspanian, M.
Copyright Year	2012
Description	Author affiliation: CEA-LETI, Minatec Campus, Grenoble, France (Peizerat, A.; Rostaing, J.; Zitouni, N.; Baier, N.; Guellec, F.; Jalby, R.; Tchagaspanian, M.)
Abstract	A new readout IC (ROIC) with a 2 step A/D conversion for cooled infrared image sensors is presented in this paper. The sensor operates at a 50Hz frame rate in an Integrate-While-Read snapshot mode. The 16 bit ADC resolution preserves the excellent detector SNR at full well (∼3Ge-). The ROIC, featuring a 320×256 array with 30µm pixel pitch, has been designed in a standard 0.18µm CMOS technology. The IC has been hybridized (indium bump bonding) to a LWIR (Long Wave Infra Red) detector fabricated using our in-house HgCdTe process. The first measurement results of the detector assembly validate both the 2-step ADC concept and its circuit implementation. This work sets a new state-of-the-art SNR of 88dB.
Starting Page	128
Ending Page	129
File Size	1585474
Page Count	2
File Format	PDF
ISBN	9781467308489
e-ISBN	9781467308496
e-ISBN	9781467308458
DOI	10.1109/VLSIC.2012.6243823
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-06-13
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Signal to noise ratio Detectors Radiation detectors CMOS integrated circuits Dynamic range Random access memory
Content Type	Text
Resource Type	Article

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