NDLI: Reliability characterization and modeling of solid-state drives

Content Provider	IEEE Xplore Digital Library
Author	Sarkar, J. Feng-Bin Sun
Copyright Year	2015
Description	Author affiliation: HGST, Western Digital, San Jose, CA, USA (Sarkar, J.; Feng-Bin Sun)
Abstract	Solid-state Drive (SSD) technology and product reliability is discussed in this paper from the perspective of overall system reliability and memory subsystem reliability. As relatively new but strongly growing segment of the high-performance storage industry, characterization of SSD reliability may be approached and clarified both from empirical system-level evaluations as well as on the basis of fundamental metrics of wear in the memory subsystem. Further, while expectations of solid-state product reliability ma y be viewed from a design standpoint of component and assembly, they require reconciliation with empirical observations of field reliability and test validations. The authors illustrate these various approaches based on reliability characterizations and modeling of SSD products. Based on such characterization data, understanding is developed on the impact of operational and environmental factors, such as, wear in the memory subsystem and temperature impact on product reliability. Reliability modeling based on intrinsic error rates of the memory subsystem across SSD populations is also presented to provide statistical estimates of SSD life based on goodness of fit analysis. Thereby, the authors explore and illustrate new conceptual underpinnings by focusing on specific characterizations and modeling towards comprehensive reliability evaluation of SSD technology and products.
Starting Page	1
Ending Page	6
File Size	603795
Page Count	6
File Format	PDF
e-ISBN	9781479967032
DOI	10.1109/RAMS.2015.7105166
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature dependence Reliability engineering Temperature distribution Industries Measurement Flash memories SSD Characterization modeling reliability
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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