NDLI: Practical applications of semiconductor reliability modeling

Content Provider	IEEE Xplore Digital Library
Author	Bechtold, L.E. Moliere, F. Sunderland, D.A. Tawfellos, B.
Copyright Year	2015
Abstract	A practical methodology for modeling the reliability of deep submicron (<;90 nm) semiconductor microcircuits provides timely and needed information for the integration of commercial off the shelf (COTS) electronics in airborne and high reliability applications. Designing and assuring customer confidence in airborne high reliability applications becomes more challenging as electronics technologies develop rapidly and commercial application demands drive the increasing use of faster, more integrated, higher density commercial off the shelf (COTS) electronics. Use of COTS electronics provides advantages of greater computational power, with higher manufacturing volumes driving better quality control. COTS also introduce the new problem of life-limited semiconductors [1]. Outdated reliability assessment methods do not address these issues or adequately support reliable aerospace system design [2]. The Semiconductor Reliability project, launched in April 2013 by the Aerospace Vehicle Systems Institute (AVSI) under the Authority for Expenditure (AFE) 83, developed a practical approach to modeling the random and wearout failure mechanisms of deep sub-micron (<;90 nm) microcircuits. Unlike prior physics of failure approaches, the methodology was kept simple and was implemented in a spreadsheet. This spreadsheet is provided free of charge to R&M practitioners to help promote understanding and common usage of the methodology. Recipients of the spreadsheet are expected to provide feedback to the AVSI team in return. The project also encourages microcircuit device suppliers to provide reliability information in some form, either by using the spreadsheet or directly providing the cumulative defect fraction (CDF) of their product in the application environments. When microcircuit device suppliers provide test data results for their products, the spreadsheet is used to scale the results from test to usage environments. The methodology developed by AVSI differs from traditional Arrhenius methods in that scaling is not only based on temperature but also on voltage, current and frequency. Models of time dependent dielectric breakdown (TDDB), hot carrier injection (HCI), negative bias temperature instability (NBTI) and electromigration (EM) are used to gain an accurate reliability assessment for technologies sensitive to these mechanisms. This paper describes the AVSI reliability research project, the semiconductor microcircuit reliability models, and provides examples of the applications of these models to support reliable avionics systems design.
Starting Page	1
Ending Page	6
File Size	407772
Page Count	6
File Format	PDF
e-ISBN	9781479967032
DOI	10.1109/RAMS.2015.7105157
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aerospace electronics Reliability engineering Integrated circuit reliability Consumer electronics Failure analysis Predictive models Semiconductor Reliability Physics-of-Failure Predictions
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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