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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wong, K.L. Lindstrom, D.L. |
| Copyright Year | 1988 |
| Description | Author affiliation: Kambea Ind., Manhattan Beach, CA, USA (Wong, K.L.; Lindstrom, D.L.) |
| Abstract | In 1981 it was revealed that the instantaneous failure rate of a piece of electronic equipment decreases with age during its useful life and that the bathtub characteristic for hazard rate is an exception rather than the rule. The shape of the hazard rate curve for this device is studied by the authors. Investigators studying semiconducting device burn-in subscribe to the concept of freak failures which manifest themselves as a hump on the hazard rate curve. The authors call these curves the roller-coaster curves. It was postulated that aside from the long-term gross wear-out failures, all other failures develop from flaws. With some general assumptions on the flaw size distribution, one can show (by applying fatigue theory) that the flaws would emerge as failures that give a decreasing failure rate. |
| Starting Page | 356 |
| Ending Page | 363 |
| File Size | 573094 |
| Page Count | 8 |
| File Format | |
| DOI | 10.1109/ARMS.1988.196476 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1988-01-26 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electronic equipment Hazards Testing Shape Satellites Manufacturing Electronics industry Semiconductivity Fatigue Inspection |
| Content Type | Text |
| Resource Type | Article |
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