NDLI: What goes up must come down (multivariate failure analysis)

Content Provider	IEEE Xplore Digital Library
Author	Sherwood, W. McNolty, F. Mirra, J.
Copyright Year	1988
Description	Author affiliation: Lockheed Missiles & Space Co. Inc., Sunnyvale, CA, USA (Sherwood, W.)
Abstract	A particular reliability problem involving approximately 1000 variables that describes the aging, manufacturing process, and environmental history of a particular component is considered. The objective is to select the small subset of these variables which has the greatest apparent causal influence on failure. One approach uses regression analysis. However, with the extremely large number of candidate variates, the selected model might provide a high multiple correlation coefficient even though the true correlation coefficient, R, is close to zero. The authors point out quantitative constraints on the size of the selected model in order to reduce the probability of a randomly attained high R value. Graphs are provided showing a specified probability that R will be less than or equal to a certain value when the true multiple correlation coefficient is zero.
Starting Page	254
Ending Page	261
File Size	623391
Page Count	8
File Format	PDF
DOI	10.1109/ARMS.1988.196456
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1988-01-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Failure analysis Missiles Statistics Aging Manufacturing processes History Regression analysis Sun Glass Helium
Content Type	Text
Resource Type	Article

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