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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Mallavarpu, N. Dawn, D. Laskar, J. |
| Copyright Year | 2011 |
| Description | Author affiliation: Georgia Electronic Design Center (GEDC), School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, 30308 USA (Mallavarpu, N.; Dawn, D.; Laskar, J.) |
| Abstract | As the gate length of CMOS processes has become smaller and the device fT has increased, applications such as CMOS power amplifiers in the millimeter-wave region have become feasible and practical. This paper describes the development of an empirical large-signal model for sub-100 nm CMOS transistors and demonstrates its successful use in the design of a 4-stage 60 GHz CMOS power amplifier with measured performance of 20dB gain, +10.3dBm P1dB, 13.5dBm Psat and 13% PAE. A novel drain-source current formulation is used, accurately modeling both strong-inversion and sub- threshold characteristics of short-channel, 90nm CMOS transistors. Further model enhancement is obtained through optimization for millimeter-wave applications using an optimized parasitic extraction process as well as the incorporation of size scalability and temperature dependency, making this modeling approach highly robust. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 654004 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424482931 |
| ISSN | 15292517 |
| e-ISBN | 9781424482924 |
| e-ISBN | 9781424482917 |
| DOI | 10.1109/RFIC.2011.5940692 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-06-05 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Semiconductor device modeling Integrated circuit modeling Power amplifiers Temperature measurement CMOS integrated circuits Solid modeling Millimeter wave transistors |
| Content Type | Text |
| Resource Type | Article |
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