NDLI: A novel model for simulation of RF oscillator phase noise

Content Provider	IEEE Xplore Digital Library
Author	Yousefi, S. Eriksson, T. Kuylenstierna, D.
Copyright Year	2010
Description	Author affiliation: Department of Signals an Systems, Chalmers University of Technology, 412 96, Gothenburg, Sweden (Yousefi, S.; Eriksson, T.) \|\| Department of MC2, Chalmers University of Technology, 412 96, Gothenburg, Sweden (Kuylenstierna, D.)
Abstract	A novel model of the RF oscillator's phase noise process has been provided in this work, resulting in a more accurate model than the conventional Wiener process. The phase noise is considered as the integration of frequency noise which consists of white and flicker noise, whereas the Wiener process is the integration result of white noise only. Analytical expressions of the oscillator RMS jitter and the Single-Side Band (SSB) phase noise (L) are presented and compared to the simulation and measurement results for verification. The relationship between $1/f^{3}-1/f^{2}$ corner frequency in the PSD and the slope transition corner in RMS jitter plot is consistent with the analytical and measurement results. The simulation result shows that the PSD of the oscillator becomes Gaussian close to the carrier, followed by power-law regions, in consistense with the analytical expression.
Starting Page	428
Ending Page	431
File Size	216710
Page Count	4
File Format	PDF
ISBN	9781424447251
DOI	10.1109/RWS.2010.5434193
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-01-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radio frequency Oscillators Phase noise 1f noise Jitter Analytical models White noise Amplitude modulation Noise measurement Phase measurement Wiener process Gaussian process jitter phase noise RF oscillator
Content Type	Text
Resource Type	Article

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