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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Silvestri, M. Tracino, E. Destefanis, R. Lobascio, C. Santin, G. Calvel, P. |
| Copyright Year | 2011 |
| Description | Author affiliation: Center for Device Thermography and Reliability (CDTR), School of Physics, University of Bristol, UK (Silvestri, M.) || Thales Alenia Space Italia, Space Environment and Habitat Unit, Strada antica di Collegno 253, 10146 Torino, Italy (Tracino, E.; Destefanis, R.; Lobascio, C.) || Thales Alenia Space, Toulouse, France (Calvel, P.) || European Space Agency, Space Environment and Effects Section, ESTEC, Noordwijk 2200AAG, The Netherlands (Santin, G.) |
| Abstract | Through the use of the Geant4 Radiation Analysis for Space (GRAS) Monte Carlo tool, we present new results on the impact of shielding composition on spacecraft electronics Soft Error Rate (SER) induced by Galactic Cosmic Rays (GCR). The comparison with the aluminum-equivalent approach is performed using both G4/GRAS and CREME96 tool on a heterogeneous set of representative devices. In particular the iron-ion spectrum has been taken as representative of the whole GCR spectrum due to its Linear Energy Transfer (LET), material penetration, and abundance characteristics. |
| Starting Page | 573 |
| Ending Page | 580 |
| File Size | 465492 |
| Page Count | 8 |
| File Format | |
| ISBN | 9781457705854 |
| ISSN | 03796566 |
| e-ISBN | 9781457705861 |
| DOI | 10.1109/RADECS.2011.6131439 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-09-19 |
| Publisher Place | Spain |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Random access memory Aluminum Materials CMOS integrated circuits Error analysis Space vehicles Monte Carlo methods galactic cosmic rays Shielding Single Event Effects Soft Error Rate MOS Radiation effects GCR |
| Content Type | Text |
| Resource Type | Article |
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