NDLI: Analysis of Turbo Decoder robustness against SEU effects

Content Provider	IEEE Xplore Digital Library
Author	Portela-Garcia, Marta Lopez-Ongil, Celia Garcia-Valderas, Mario Entrena, Luis Lestriez, Bruno Berrojo, Luis
Copyright Year	2008
Description	Author affiliation: Electronic Technology Department, Carlos III University of Madrid, c/Butarque, 15. Leganes. 28911, Spain (Portela-Garcia, Marta; Lopez-Ongil, Celia; Garcia-Valderas, Mario; Entrena, Luis) \|\| VLSI Group of Thales Alenia Space Spain. c/Einsteina, 7 (PTM) E-28760 Tres Cantos. Madrid. Spain (Lestriez, Bruno; Berrojo, Luis) Wireless communications were clearly enhanced since 90's thanks to Turbo Codes. The use of these codes in satellites and deep-space exploration could be ruined if radiation effects exceed their correction capability. SEU sensitivity of a Turbo Decoder intended for space applications has been analyzed in detail, injecting millions of faults by means of using an Autonomous Emulation System. Specifically, around 34.5 Mfaults per test in a sweep for four different parameters have been injected.
Starting Page	401
Ending Page	405
File Size	448173
Page Count	5
File Format	PDF
ISBN	9781457704819
ISSN	03796566
e-ISBN	9781457704826
DOI	10.1109/RADECS.2008.5782752
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-09-10
Publisher Place	Finland
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Decoding Emulation Turbo codes Flip-flops Sensitivity Field programmable gate arrays Transient Fault Emulation Turbo Decoder Wireless Communication Deep-Space Exploration Radiation Hardening SEU Effects
Content Type	Text
Resource Type	Article

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