NDLI: Improving Reliability of SRAM-Based FPGAs by Inserting Redundant Routing

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Improving Reliability of SRAM-Based FPGAs by Inserting Redundant Routing

Content Provider	IEEE Xplore Digital Library
Author	Filho, C.K. Kastensmidt, F.L. Carro, L.
Copyright Year	2005
Description	Author affiliation: Univ. Estadual do Rio Grande do Sul, Rio Grande (Filho, C.K.; Kastensmidt, F.L.; Carro, L.)
Abstract	This work proposes a new fault-tolerant method able to deal with open and shortcut circuit faults in SRAM-based FPGA routing connections. The bitflips provoked by upsets in the routing control memory cells are the major concern in SRAM-based FPGAs, since these memory cells represent the majority of the bits in the configuration bitstream. Even in an application hardened by triple modular redundancy (TMR), upsets in the routing bits still represent a major problem, due to the possibilities of short and open circuits that can happen in more than one redundant block of the TMR The idea presented in this paper is to create local redundancy in the routing, so that whenever the critical connection fails, the redundant one ensures a working connection by propagating the correct value. The proposed method is based on duplication of the internal critical connections. A detailed classification and test of each case solution is explained in this paper. Preliminary results show the efficiency of this method to reduce error due routing upsets.
File Size	4666387
File Format	PDF
ISBN	9780780395015
ISSN	03796566
DOI	10.1109/RADECS.2005.4365640
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-09-19
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Field programmable gate arrays Routing Circuit faults Logic Redundancy Fault tolerance Random access memory Single event upset Table lookup Testing field programmable gate arrays fault tolerance routing
Content Type	Text
Resource Type	Article

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