NDLI: Aliasing-free space and time compactions with limited overhead

Content Provider	IEEE Xplore Digital Library
Author	Jin Ding Moloney, D. Xiaojun Wang
Copyright Year	2000
Description	Author affiliation: Silicon Syst. Ltd., Dublin, Ireland (Jin Ding)
Abstract	Space- and time-oriented compactions are to reduce the output response data width and length of circuits under test for built-in self-test technique. In this paper, the space- and time-oriented compaction techniques are considered together. First, the space-oriented data compaction technique is analyzed. We present a scheme, which can compress the data of k-output circuit into 1-bit signature stream with zero-aliasing and zero-performance-degradation for single stuck-line faults. Based on the investigation of the space's odd-sensitized and space's even-sensitized faults of the circuits under test, we discuss the compact methods of space's odd sensitization and space's even sensitization test responses, respectively. The graph coloring is adopted to decrease space compactor overhead. The coloring complexity is greatly decreased owing to only painting the output notes with respect to the space's even-sensitized faults. Next, we take into account the time-oriented data compaction scheme. We use the property that a test vector detects multiple faults in the time's even sensitization response compaction. In the time-oriented compaction approach developed in this paper, an s-bit long data stream can be compressed to an r-bit signature with zero-aliasing, where s/spl Gt/r. Experimental results are presented to demonstrate the effectiveness of the proposed space- and time-oriented compaction techniques.
Starting Page	355
Ending Page	360
File Size	52334
Page Count	6
File Format	PDF
ISBN	0769505252
DOI	10.1109/ISQED.2000.838896
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-03-22
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Compaction Circuit testing Built-in self-test Automatic testing Circuit faults Silicon Electronic equipment testing System testing Painting Registers
Content Type	Text
Resource Type	Article

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