NDLI: Flash X-ray diffraction system for fast, single-pulse temperature and phase transition measurements

Content Provider	IEEE Xplore Digital Library
Author	Morgan, Dane V. Macy, Don R. Madlener, Michael J. Morgan, Jiaming G.
Copyright Year	2007
Description	Author affiliation: National Security Technologies, LLC, 182 East Gate Drive, Los Alamos, NM 87544 USA (Morgan, Dane V.; Macy, Don R.; Madlener, Michael J.; Morgan, Jiaming G.)
Abstract	A new, fast, single-pulse diagnostic for determining phase transitions and measuring the bulk temperature of polycrystalline metal objects has been developed. The diagnostic consists of a 37-stage Marx bank with a cable-coupled X-ray diode that produces a 35-ns pulse of mostly 0.71-Å monochromatic X rays and a P-43 fluor coupled to a cooled, charge-coupled device camera by a coherent fiber-optic bundle for detection of scattered X rays. The X-ray beam is collimated to a 1° divergence in the scattering plane with the combination of a 1.5-mm tungsten pinhole and a 1.5-mm-diameter molybdenum anode. X rays are produced by a high-energy electron beam transiting inward from the cathode to the anode in a needle-and-washer configuration. The anode’s characteristic K-α X-ray emission lines are utilized for this diffraction system. The X-ray anode is heavily shielded in all directions other than the collimated beam. The X-ray diode has a sealed reentrant system, allowing X rays to be produced inside a vacuum containment vessel, close to the sample under study.
Starting Page	209
Ending Page	212
File Size	470576
Page Count	4
File Format	PDF
ISBN	9781424409136
DOI	10.1109/PPPS.2007.4651823
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-06-17
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray diffraction Temperature measurement Diffraction Scattering Tin Anodes Atomic measurements
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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