NDLI: Capacitance and inductive influence of fusing behavior

Content Provider	IEEE Xplore Digital Library
Author	Buneo, J.D. Zirnheld, J.L. Burke, K.M. Meade, J.P. Jones, J.C. Sarjeant, W.J.
Copyright Year	2003
Description	Author affiliation: Energy Syst. Inst., Buffalo Univ., NY, USA (Buneo, J.D.; Zirnheld, J.L.; Burke, K.M.; Meade, J.P.; Jones, J.C.; Sarjeant, W.J.)
Abstract	A fusing technique is currently being investigated at the Energy Systems Institute that will utilize a thin film planar geometry. The film is capacitor grade, metallized polypropylene at seven microns thick, and was cut to sizes of 12" /spl times/ 3/4". The metallization consists of aluminum and has a surface resistance of 7 /spl Omega//square. The fusing technique under evaluation consists of a 2 /spl mu/F 12.5 kV/sub dc/ filter capacitor which is used to supply the 2500 V/sub dc/ to cause the desired fusing action. Initial measurements show an impulse current of 6 A and pulse duration of 50 /spl mu/s. As this was a filter capacitor, the inductance was assumed to be higher than an energy discharge capacitor and thus the energy discharge time would be slower. To confirm a high inductance, a GENRAD 1689 Precision RLC Digibridge was used to measure the stray inductance of the capacitor. The stray inductance was found to be approximately 12 mH, which is extremely high. An energy discharge capacitor will be inserted into the experimental setup to lower the inductance and decrease the energy discharge time.
Sponsorship	Pulsed Power Sci. and Technol. Committee of the IEEE Nuclear and Plasma Sci. Soc
Starting Page	1379
Ending Page	1381
File Size	190382
Page Count	3
File Format	PDF
ISBN	0780379152
DOI	10.1109/PPC.2003.1278072
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-06-15
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Capacitance Capacitors Inductance Metallization Surface resistance Filters Pulse measurements Transistors Geometry Aluminum
Content Type	Text
Resource Type	Article

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