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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hui Shi Lizhu Liu Ling Weng Weiwei Cui Yuanyuan Li Liu Lizhu |
| Copyright Year | 2015 |
| Description | Author affiliation: Coll. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Harbin, China (Hui Shi; Lizhu Liu; Ling Weng; Weiwei Cui; Yuanyuan Li) || Key Lab. of Eng. Dielectr. & Its Applic., Harbin Univ. of Sci. & Technol., Harbin, China (Liu Lizhu) |
| Abstract | Polyimide (PI)/Aluminum oxide $(Al_{2}O_{3})$ nanocomposite films wtih tri-layer structures $(PI-Al_{2}O_{3}/PI/PI-Al_{2}O_{3})$ are manufactured from pyromellitic dianhydride (PMDA) and 4,4'-oxydianiline (ODA) via in-situ polymerization method. Microstructure, dielectric property and electrical conductivity of the nanocomposite films are characterized in this paper. Transmission Electron Microscope (TEM) and X-Ray Diffraction (XRD) results show that $nano-Al_{2}O_{3}$ particles are successfully introduced into target tri-layered structure and are homogeneously dispersed in the polyimide matrix. Compared with pure films, the obtained composite films perform lower relative permittivity at low $nano-Al_{2}O_{3}$ doping content (0-8wt%) and higher relative permittivity at high $nano-Al_{2}O_{3}$ doping content (>8wt%). The dielectric loss (loss tangent) of the composite films is higher than that of the pure films at the same frequency, and increases consistently with the increase of $nano-Al_{2}O_{3}$ content, especially in low frequency range. Furthermore, at the same $nano-Al_{2}O_{3}$ concentration, the dielectric loss of the composite films reduces at frequencies <;103 Hz and increases at frequencies >103 Hz. The effect of $nano-Al_{2}O_{3}$ on electrical conductivity is only observed clearly at low frequency region (<;10Hz). The above-mentioned dielectric property depends on the interaction and compromise of two kinds of polarization, i.e., interfacial polarization and anti-orientation polarization, which are attributed to the interfacial defect effect and blocking effect of $nano-Al_{2}O_{3}$ particles, respectively. |
| Starting Page | 512 |
| Ending Page | 515 |
| File Size | 1121535 |
| Page Count | 4 |
| File Format | |
| ISSN | 21609241 |
| e-ISBN | 9781479989034 |
| DOI | 10.1109/ICPADM.2015.7295321 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-07-19 |
| Publisher Place | Australia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Films Aluminum oxide Doping Polyimides Permittivity Dielectric losses Dielectric properties Polyimide Tri-layer structure Nano-Al |
| Content Type | Text |
| Resource Type | Article |
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