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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Seung-Yeop Yoo Sang-Burm Jung Jae Chul Park Young-Soo Kwon |
| Copyright Year | 1997 |
| Description | Author affiliation: Dept. of Electr. Eng., Dong-A Univ., Pusan, South Korea (Seung-Yeop Yoo) |
| Abstract | We investigated electric and dielectric properties of metal/insulator/metal (MIM) device using maleate copolymer LB films. The thickness of maleate copolymer LB film measured by ellipsometry and X-ray diffraction was about 27-30[/spl Aring/]. The maleate copolymer LB films have the property of insulators such as organic ultra-thin films. The electrical conduction mechanism was Schottky current determined by the measurement of current-voltage characteristics, and its conductivity was 10/sup -14/-10/sup -15/ [S/cm]. Dielectric constant was about 5.0-6.0 using various measurement methods: I-V and frequency-dependent dielectric properties. Schottky barrier was about 0.9-1.0[eV]. The activation energy was 0.74 [eV] from the measurement of current-temperature characteristics. The frequency-dependent dielectric properties involved orientational polarization by the dipole. |
| Starting Page | 685 |
| Ending Page | 688 |
| File Size | 279558 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780326512 |
| DOI | 10.1109/ICPADM.1997.616528 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1997-05-25 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectric measurements Dielectric devices Metal-insulator structures Dielectrics and electrical insulation Current measurement Frequency Thickness measurement Ellipsometry X-ray diffraction Conductivity measurement |
| Content Type | Text |
| Resource Type | Article |
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