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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hanique, E. So, E. |
| Copyright Year | 2014 |
| Description | Author affiliation: Meas. Sci. & Stand., Nat. Res. Council of Canada, Ottawa, ON, Canada (So, E.) || DNV-KEMA, Netherlands (Hanique, E.) |
| Abstract | This paper describes the diagnostic measurements involved while performing impulse tests. For most applications during impulse tests, the impulse voltage and impulse current are measured. Because of the nature of impulse test it is very common that Electro Magnetic Interference signals (EMI) are generated. This EMI will influence the measurement results. Therefore these tests are done in a well-shielded high voltage laboratories. The relevant sensors e.g. voltage dividers, current shunts and other components used for the measurements, including traceability issues, will be discussed as part of the presentation. |
| Starting Page | 380 |
| Ending Page | 381 |
| File Size | 264656 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781479952052 |
| ISSN | 21600171 |
| e-ISBN | 9781479924790 |
| DOI | 10.1109/CPEM.2014.6898418 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-08-24 |
| Publisher Place | Brazil |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Current measurement Voltage measurement Calibration Uncertainty Standards Sensors Software shunt and uncertainty Divider electro mechanical compatibility impulse measurement |
| Content Type | Text |
| Resource Type | Article |
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