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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Liu Chao Sharma, A. Afsar, M.N. |
| Copyright Year | 2012 |
| Description | Author affiliation: High Frequency Material Measurement and Information Center, Department of Electrical and Computer Engineering, Tufts University, Medford, MA 02155-5528, USA (Liu Chao; Sharma, A.; Afsar, M.N.) |
| Abstract | Two different types of instrumentation have been utilized to characterize thin film samples. New techniques have been developed so that the dielectric permittivity values can be determined accurately at microwave as well as at millimeter wave and terahertz frequencies. A specially designed slotted cavity for X-band microwave measurement has been employed with a vector network analyzer to overcome the phase shift not large enough to evaluate the real part of dielectric permittivity. Also, dispersive Fourier transform spectroscopy (DFTS) with an improved movement step has been implemented to determine the real part of permittivity from about 60 GHz to 1,000 GHz. |
| Starting Page | 76 |
| Ending Page | 77 |
| File Size | 126765 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781467304399 |
| ISSN | 21600171 |
| e-ISBN | 9781467304429 |
| DOI | 10.1109/CPEM.2012.6250668 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-07-01 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Permittivity Permittivity measurement Frequency measurement Cavity resonators Dielectrics Materials error analysis Thin film slotted cavity microwave terahertz dielectric permittivity dispersive Fourier transform spectroscopy |
| Content Type | Text |
| Resource Type | Article |
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