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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hahn, K. Maenchen, J.E. Cordova, S. Molina, I. Portillo, S. Rovang, D. Schamiloglu, E. Welch, D.R. Oliver, B.V. Rose, D.V. |
| Copyright Year | 2004 |
| Description | Author affiliation: Sandia Nat. Lab., Albuquerque, NM, USA (Hahn, K.; Maenchen, J.E.; Cordova, S.; Molina, I.; Portillo, S.; Rovang, D.) |
| Abstract | Paraxial diodes have been a stronghold for high-brightness, flash X-ray radiography. In its traditional configuration, an electron beam impinges onto an anode foil, entering a gas-filled transport cell. Within the cell, the beam is focused into a small spot onto a high-Z target to generate X-rays for the radiographic utility. Simulations using Lsp, a particle-in-cell code, have shown that within the gas-filled focusing cell the electron beam spot location sweeps axially during the course of the beam pulse. The result is a larger radiographic spot than is desirable. Lsp has also shown that replacing the gas-filled cell with a fully ionized plasma on the order of 10/sup 16/ cm/sup -3/ will prevent the spot from significant beam sweeping, thus resulting in a smaller, more stable radiographic spot size. Sandia National Laboratories (SNL) is developing a plasma-filled focusing cell for future paraxial diode experiments. A z-discharge in a hydrogen fill is used to generate a uniform, highly ionized plasma. Laser interferometry is the key diagnostic to determine electron density in a light lab setting and during future paraxial diode shots on SNL's RITS-3 accelerator. A time-resolved spot diagnostic will also be implemented during diode shots to measure the change in spot size during the course of the pulse. |
| Starting Page | 429 |
| Ending Page | 432 |
| File Size | 732036 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780385861 |
| DOI | 10.1109/MODSYM.2004.1433604 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-05-23 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Radiography Diodes Plasma stability Plasma accelerators Electron beams Particle beams Plasma density Plasma diagnostics Plasma measurements Pulse measurements |
| Content Type | Text |
| Resource Type | Article |
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